The Kratos Axis Ultra utilises high resolution X-ray Photoelectron Spectroscopy (XPS) to investigate elements in the outermost atomic layers of materials. Also known as Electron Spectroscopy for Chemical Analysis (ESCA), this technique can examine a wide array of materials such as metals, minerals, polymers, biomaterials, textiles, semiconductors, ceramics and glass.

The Axis Ultra is commonly used to determine the chemical states, bonding environments and elemental composition, concentration and distribution of surface layers 1 - 5nm in depth.

Capabilities

• Surface sensitive analysis to a depth of 10nm
• Elemental identification and quantification
• Chemical state information
• Spectroscopy scan areas from 300x700µm slot down to 15µm circular area
• Fast spectroscopy with resolution better than 0.5eV
• Parallel imaging with spatial resolution of 7µm and chemical state deconvolution from stacked images at e.g. 0.1eV energy steps
• Monochromated X-ray source - small spot size reduces damage to sensitive samples and monochromation gives better energy resolution
• UPS for valence band information
• Angle resolved measurements

Wide range of samples

• Effective charge compensation, so almost any type of non-gassy sample, including non-conductors can be analysed
• Sample size: typically 1cm diameter discs or square (but larger items can be accommodated)
• Fast entry lock
• Multi sample holders and programmable stage positions for routine analyses
• Gas dosing
• Argon ion gun for depth profiling thin layered samples and cleaning

Sample temperature management

• Cooling to -100 °C
• Heating to 600 °C
• Temperature programmes

Preparation Chamber

• Ultrahigh vacuum 5x10-10 Torr
• Full sample cooling () and heating (1200C) facilities
• Ports available for
• Sample diagnostics
• Evaporation facilities

X-ray sources and UV illumination

• Monochromated Al kalpha X-ray gun
• Dual anode Al/Mg X-ray gun
• UV lamp